Marvin Test Solutions: MV-GX5960: High Performance Dynamic Digital I/O PXI Subsystem Card

Marvin Test Solutions: MV-GX5960: High Performance Dynamic Digital I/O PXI Subsystem Card
Preis auf Anfrage.
  • MV-GX5960
Downloads
Model Marvin Test Solutions: MV-GX5960 High Performance Dynamic Digital I/O PXI Subsystem... mehr
Produktinformationen "Marvin Test Solutions: MV-GX5960: High Performance Dynamic Digital I/O PXI Subsystem Card"

Model Marvin Test Solutions: MV-GX5960
High Performance Dynamic Digital I/O PXI Subsystem Card

  • Cycle based, 50 MHz dynamic digital subsystem with high performance timing generator
  • High voltage pin electronics with per channel programmability
  • Per channel parametric measurement unit (PMU)
  • Analog bus access for each I/O channel
  • Dual level drive / sense, and programmable load on a per channel basis
  • Supports sngle-ended or differential channel configurations
  • 256 timing sets with 4 phases and 4 windows
  • 0 - 64 us phase and window programming range
  • Supports up to 528 bi-directional I/O channels
  • 256K of vector memory
  • Comprehensive software tool set supports CASS legacy programs and importing of IEEE -1445 compliant vector files
  • 6U PXI Instrument

Scope of Delivery:

  • Marvin Test Solutions MV-GX5960: High Performance Dynamic Digital I/O PXI Subsystem Card
  • Manual
  • Certificate of Calibration

Marvin Test Solutions

Weiterführende Links zu "Marvin Test Solutions: MV-GX5960: High Performance Dynamic Digital I/O PXI Subsystem Card"
Zuletzt angesehen